DIGITAL ANALYZING OF THE SEM IMAGE OF THE POROUS ANCIENT CERAMIC

Abstract

Scanning electron microscopy (SEM) provides resolutions on the order of a nanometer. One of the problems associated with SEM images is variations in brightness due to electron imaging defects. These variations render image processing operations such as segmentation more difficult. The correction requires estimation of the global illumination field. We present a method to sharpen a non-uniformly brightness image by use of wavelet transformation. This analysis deals with the method to enhance an image to correct for non-uniform brightness, and then use the enhanced image to identify the depth of individual pores. Both the fine characteristics and object edges in the image are well enhanced without degrading the contrast. The 3D surface topography for intensity distribution of porous ceramic is presented.